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JEDEC Standard, JESD22b112, High Temperature Package Warpage Measurement Methodology, May 2005 wwwjedecorg 13 Benlih Huang, Ning-Cheng Lee, Conquer Tombstoning in Lead-Free Soldering, IPC Printed Circuits Expo, SMEMA Council, APEX Designers Summit 2004, pp S27-1 S27-7 14 Lei L Mercado, Vijay Sarihan, Yifan Guo, and Andrew Mawer, Impact of Solder Pad Size on Solder Joint Reliability in Flip Chip PBGA Packages, IEEE Transactions On Advanced Packaging, Vol 23, No 3, August 2000, pp 415 420 15 IPC-7351, Generic Requirements for Surface Mount Design and Land Pattern Standard, IPC, February 2005 wwwipcorg 16 Marie S Cole, J Jozwiak, E Kastberg, G Martin, Compressive Load Effects On CCGA Reliability, SMTA International, September 2002..

17 Michael L Eyman, Gary B Kromann, Investigation of Heat Sink Attach Methodologies and the Effects on Package Structural Integrity and Interconnect Reliability of the 119-Lead Plastic Ball Grid Array, Electronic Components and Technology Conference, 1997, pp 1068 1075 18 Deepak Goyal,Tim Lane, Patrick Kinzie, Chris Panichas, Kam Meng Chong, Oscar Villalobos, Failure Mechanisms of Brittle Solder Joint Fracture in the Presence of Electroless Nickel Immersion Gold (ENIG) Interface, Electronic Components and Technology Conference, 2004, pp 732 739 19 Kozo Harada, Shinji Baba, Qiang Wu, Hironori Matsushima, Toshihiro Matsunaga, Yasumi Uegai, Michitaka Kimura, Analysis of Solder Joint Fracture under Mechanical Bending Test, Electronic Components and Technology Conference, 2003 pp 1731 1737 20 Shelgon Yee, Lodgers Chen, Justin Zeng, Roger Jay, Ternary Intermetallic Compound - A Real Threat To BGA Solder Joint Reliability, Journal of SMT, 2004, Vol 17, Issue 2, pp 29 36 21.

Chong Kam Meng, Tamil Selvy Selvamuniandy, and Charan Gurumurthy, Discoloration related failure mechanism and its root cause in Electroless Nickel Immersion Gold (ENIG) Pad metallurgical surface finish, Proceedings of 11th IPFA, Taiwan, 2004, pp 229 233 22 Tz-Cheng Chiu, Kejun Zeng, Roger Stierman, Darvin Edwards, Kazuaki Ano, Effect of Thermal Aging on Board Level Drop Reliability for Pb-free BGA Packages , Electronic Components and Technology Conference, 2004 pp 1256 1262 23 Kejun Zeng, Roger Stierman, Tz-Cheng Chiu, Darvin Edwards, Kirkendall void formation in eutectic SnPb solder joints on bare Cu and its effect on joint reliability, Journal of Applied Physics, 2005, 97, 024508 24 Zequn Mei, Mudasir Ahmad, Mason Hu, Gnyaneshwar Ramakrishna, Kirkendall Voids at Cu/Solder Interface and Their Effects on Solder Joint Reliability, Electronic Components and Technology Conference, 2005, pp 415 420 25 IPC/JEDEC-9704, Printed Wiring Board Strain Gage Test Guideline, June 2005 wwwjedecorg 26 J H.

{{03 Nov 09 Harprit Sandhu MCP3202Read1.Spin Propeller Tool 1.2.6 16 Program 3 All the code in this program is in Spin. This program reads channel 0 of the MCP3202 and displays the results on the LCD both as a decimal value and as a binary value so that you can see the bits flip as you turn the potentiometer. The 3202 chip is connected as follows: 1 Chip select 2 Channel 0 for voltage input from Pot 3 Channel 1 for voltage input from Pot, not used 4 Ground Vss 5 Data into 3202 for setup 6 Data out from 3202 to be read into Propeller 7 Clock to read in the data 8 Power 5 volts Vdd The Potentiometer is connected as follows: Left Ground Center To pin 2 of the 3202 Right Power 5 volts I used a 50K Pot The 1 2 3 4 5 6 7 8 9 10 11 12 13 14 connections to the LCD Ground Power 5 volts Ground P16 P17 P18 Not connected, using 4 Not connected, using 4 Not connected, using 4 Not connected, using 4 Data high nibble Data high nibble Data high nibble Data high nibble are as follows:

Lau (ed), Ball Grid Array Technology, McGraw-Hill, New York, 1995 27 Commission Decision of 21 October 2005, Amending for the Purposes of Adapting to Technical Progress the Annex to Directive 2002/95/EC of the European Parliament and of the Council on the Restriction of the Use of Certain Hazardous Substances in Electrical and Electronic Equipment (Notified Under Document Number C(2005) 4054) 2005/747/EC, Official Journal of the European Union, EN, 25102005, L280/18 19 http://eur-lexeuropaeu/LexUriServ/site/en/oj/2005/l_280/l_ 28020051025en00180019pdf 28 Yuan Li, Anil Pannikkat, Larry Anderson, Tarun Verma, Bruce Euzent, Building Reliability into Full-Array BGAs, 26th IEMT Symposium PackCon, 2000, pp A-1-A-7 29 R R Tummala, E J Rymaszewski, and A G Klopfenstein (eds), Microelectronics Packaging Handbook, Chapman & Hall, New York, 1997 30 J H Lau (ed), Thermal Stress and Strain in Microelectronics Packaging,Van Nostrand Reinhold, New York, 1993 31 J M Gere and S P.